Submission Title

2D Materials Under the Scanning Probe Microscope

Subject Area

Physics/Applied Physics

Description

2D materials exhibit unique properties on the microscopic scale. Conductive 2D materials in particular show novel electrical properties. By constructing electrical devices from 2D materials, these properties can be investigated. However, traditional electrical microscopic measurement techniques involve direct methods which can permanently alter sensitive 2D device samples. The Atomic Force Microscope (AFM) provides the capabilities to measure the properties of 2D samples without risk of permanent damage. A method known as Scanning Kelvin Probe Force Microscopy (SKPM) produces detailed electric potential measurements through a voltage bias between the scanning apparatus and the sample. Our research project currently involves the optimization of SKPM through the utilization of frequency based modulation and investigating other direct electrical measurement techniques that the AFM offers.

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2D Materials Under the Scanning Probe Microscope

2D materials exhibit unique properties on the microscopic scale. Conductive 2D materials in particular show novel electrical properties. By constructing electrical devices from 2D materials, these properties can be investigated. However, traditional electrical microscopic measurement techniques involve direct methods which can permanently alter sensitive 2D device samples. The Atomic Force Microscope (AFM) provides the capabilities to measure the properties of 2D samples without risk of permanent damage. A method known as Scanning Kelvin Probe Force Microscopy (SKPM) produces detailed electric potential measurements through a voltage bias between the scanning apparatus and the sample. Our research project currently involves the optimization of SKPM through the utilization of frequency based modulation and investigating other direct electrical measurement techniques that the AFM offers.