Faculty Publications

Publication Date

2002

Disciplines

Electromagnetics and Photonics | Materials Science and Engineering | Physics

Abstract

Defects in the band gap of CuIn1-xGaxSe2 have been characterized using transient photocapacitance spectroscopy. The measured spectra clearly show response from a band of defects centered around 0.8 eV from the valence band edge as well as an exponential distribution of band tail states. Despite Ga contents ranging from Ga/(In+Ga)=0.0 to 0.8, the defect bandwidth and its position relative to the valence band remain constant. This defect band may act as an important recombination center, contributing to the decrease in device efficiency with increasing Ga content.

Document Type

Published Version

Comments

This article is the publisher-created version, also considered to be the final version or the version of record. It includes value-added elements provided by the publisher, such as copy editing, layout changes, and branding consistent with the rest of the publication.

Rights

© 2002 American Institute of Physics

Original Citation

Jennifer T. Heath, J. David Cohen, William N. Shafarman, Dongxiang Liao, & Angus Rockett
Effect of Ga Content on Defect States in CuIn1-xGaxSe2 Photovoltaic Devices.
Applied Physics Letters, 2002, volume 80, issue 24, pages 4540-4542
doi:10.1063/1.1485301

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