Location

Jereld R. Nicholson Library

Subject Area

Physics

Description

The electronic properties of low cost, thin-film solar cells are complicated by the non-ideal nature of the semiconductor layers. Typically, the fundamental electronic properties of such materials are evaluated using current-voltage and capacitance-voltage measurements. However, in these devices, it is common for the back contact to be non-ohmic. We are exploring the impact of such a back contact on the outcome of standard capacitance-based characterization techniques. We compare computer models of capacitance response with measurements of simple model electronic circuits and of solar cell devices.

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May 16th, 4:30 PM May 16th, 6:00 PM

Role of Contacts in Capacitance Measurements of Solar Cells

Jereld R. Nicholson Library

The electronic properties of low cost, thin-film solar cells are complicated by the non-ideal nature of the semiconductor layers. Typically, the fundamental electronic properties of such materials are evaluated using current-voltage and capacitance-voltage measurements. However, in these devices, it is common for the back contact to be non-ohmic. We are exploring the impact of such a back contact on the outcome of standard capacitance-based characterization techniques. We compare computer models of capacitance response with measurements of simple model electronic circuits and of solar cell devices.

 

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